Image Analysis: 22nd Scandinavian Conference, SCIA 2023, Sirkka, Finland, April 18–21, 2023, Proceedings, Part II (Lecture Notes in Computer Science)

Image Analysis: 22nd Scandinavian Conference, SCIA 2023, Sirkka, Finland, April 18–21, 2023, Proceedings, Part II (Lecture Notes in Computer Science)
by: Rikke Gade (Editor),Michael Felsberg (Editor),Joni-Kristian Kämäräinen (Editor)&0more
Publisher: Springer
Edition: 1st ed. 2023
Publication Date: 2023/4/27
Language: English
Print Length: 636 pages
ISBN-10: 3031314379
ISBN-13: 9783031314377
Book Description
This two-volume set (LNCS 13885-13886) constitutes the refereed proceedings of the 23rd Scandinavian Conference on Image Analysis, SCIA 2023, held in Lapland, Finland, in April 2023.The 67 revised papers presented were carefully reviewed and selected from 108 submissions. The contributions are structured in topical sections on datasets and evaluation; action and behaviour recognition; image and video processing, analysis, and understanding; detection, recognition, classification, and localization in 2D and/or 3D; machine learning and deep learning; segmentation, grouping, and shape; vision for robotics and autonomous vehicles; biometrics, faces, body gestures and pose; 3D vision from multiview and other sensors; vision applications and systems.
About the Author
This two-volume set (LNCS 13885-13886) constitutes the refereed proceedings of the 23rd Scandinavian Conference on Image Analysis, SCIA 2023, held in Lapland, Finland, in April 2023.The 67 revised papers presented were carefully reviewed and selected from 108 submissions. The contributions are structured in topical sections on datasets and evaluation; action and behaviour recognition; image and video processing, analysis, and understanding; detection, recognition, classification, and localization in 2D and/or 3D; machine learning and deep learning; segmentation, grouping, and shape; vision for robotics and autonomous vehicles; biometrics, faces, body gestures and pose; 3D vision from multiview and other sensors; vision applications and systems. Read more