Surface and Thin Film Analysis 2
Get this book Contact Email: girro@qq.com
Editorial Reviews
Review
"..a useful resource.." Journal of the American Chemical Society
Product Description
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.
From a Review of the First Edition (edited Author: Bubert and Jenett)
".. a useful resource.."
(Journal of the American Chemical Society)
Hardcover: 558 pages
Publisher: Wiley-VCH; 2 edition (June 21, 2011)
Language: English
ISBN-10: 3527320474
ISBN-13: 9783527320479
Product Dimensions: 9.7 x 6.5 x 1.2 inches
未经允许不得转载：电子书百科大全 » Surface and Thin Film Analysis 2