Software Trace and Log Analysis: A Pattern Reference

Software Trace and Log Analysis: A Pattern Reference (Pattern-Oriented Software Diagnostics)
by Dmitry Vostokov (Author), Software Diagnostics Institute (Author)
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Language ‏ : ‎ English
ASIN ‏ : ‎ B01N0DXRBE
Publisher ‏ : ‎ OpenTask; 2nd edition (November 15, 2016)
Publication date ‏ : ‎ November 15, 2016
ISBN-10 ‏ : ‎ 1908043822
ISBN-13 ‏ : ‎ 9781908043825
Book Description
General trace and log analysis patterns allow application of uniform problem detection and solving approach across diverse software environments. This pattern language covers any execution artifact from a small debugging trace to a distributed log with billions of messages from hundreds of computers, thousands of software components, threads, and processes. Pattern-oriented trace and log analysis is applicable to troubleshooting and debugging Windows, Mac OS X, Linux, FreeBSD, Android, iOS, z/OS, and any other possible computer platform including networking and IoT. Its pattern catalog is a part of pattern-oriented software diagnostics, forensics, prognostics, root cause analysis, and debugging developed by Software Diagnostics Institute (DumpAnalysis.org + TraceAnalysis.org). This reference reprints with corrections 133 patterns originally published in Memory Dump Analysis Anthology volumes 3 – 9 and Software Diagnostics Library (former Crash Dump Analysis blog, DumpAnalysis.org/blog). Full-color diagrams accompany most pattern descriptions. The second edition includes 33 more patterns and improved pattern index.