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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

2016-07-22 分类：物理学评论(0)

Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
Authors: R.F. Egerton
ISBN-10: 3319398768
ISBN-13: 9783319398761
Edition: 2nd ed. 2016
Released: 2016-08-02
Hardcover: 181 pages
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