Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications
Authors: Haugstad, Greg
Get this book Contact Email: girro@qq.com
Publisher: Wiley(2012/9/4)
Edition: 1
Language: English
ISBN-13: 9780470638828
e-ISBN-13: 9781118360682

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