Statistical Analysis of Spatial and Spatio-Temporal Point Patterns, Third Edition (Chapman & Hall/CRC Monographs on Statistics & Applied Probability)
Authors: Peter J. Diggle - Peter Diggle
ISBN-10: 1466560231
ISBN-13: 9781466560239
Edition: 3
Release: July 23, 2013
Hardcover: 300 pages
List Price $79.95
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