Reliability Modeling with Applications: Essays in Honor of Professor Toshio Nakagawa on His 70th Birthday
Authors: Nakamura, Syouji; Qian, Cun Hua; Chen, Mingchih
Get this book Contact Email: girro@qq.com
Publisher: World Scientific Publishing Company ( 2013-12-12 )
ISBN-13: 9789814571937
e-ISBN-13: 9789814571944
ISBN-10: 9814571938
QQ: 7450911
Language: English
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