Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability
Authors: Dumin, D. J
Get this book Contact Email: girro@qq.com
Publisher: World Scientific Publishing Company ( 2002-01-18 )
ISBN-13: 9789810248420
e-ISBN-13: 9789812778062
ISBN-10: 9810248423
QQ: 7450911
Language: English
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