Helium Ion Microscopy: Principles and Applications

Helium Ion Microscopy: Principles and Applications
Authors: Joy, David C

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Publisher: Springer ( 2013/9/13 )
ISBN-13: 9781461486596
e-ISBN-13: 9781461486602
ISBN-10: 1461486599
QQ: 7450911
Edition: 1
Language: English
Category: Science; Engineering; Science: Biology / Natural History

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