Ion Beam Analysis: Fundamentals and Applications
Authors: Nastasi, Michael; Mayer, James W.; Wang, Yongqiang
Get this book Contact Email: girro@qq.com
Publisher: Taylor and Francis ( 2014-07-29 )
ISBN-13: 9781439846384
e-ISBN-13: 9781439846391
ISBN-10: 1439846383
QQ: 7450911
Language: English
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