Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications
Authors: Servin, Manuel; Quiroga, J. Antonio; Padilla, Moises
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Publisher: Wiley ( 2014-05-27 )
ISBN-13: 9783527411528
e-ISBN-13: 9783527681082
ISBN-10: 3527411526
QQ: 7450911
Edition: 1
Language: English
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